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32938 results
First page123...209620982100...274327442745Last page
UNE EN 60715:2017
Dimensions of low-voltage switchgear and controlgear - Standardized mounting on rails for mechanical support of switchgear, controlgear and accessories (Endorsed by Asociación Española de Normalización in December of 2017.)
Vydáno: 2017-12-01
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UNE EN 60728-13-1:2017
Cable networks for television signals, sound signals and interactive services - Part 13-1: Bandwidth expansion for broadcast signal over FTTH system (Endorsed by Asociación Española de Normalización in December of 2017.)
Vydáno: 2017-12-01
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UNE EN 60728-7-1:2005/A1:2015
Cable networks for television signals, sound signals and interactive services - Part 7-1: Hybrid Fibre Coax Outside Plant Status Monitoring - Physical (PHY) Layer Specification (Endorsed by AENOR in August of 2015.)
Vydáno: 2015-08-01
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UNE EN 60747-16-4:2004/A2:2017
Semiconductor devices - Part 16-4: Microwave integrated circuits - Switches (Endorsed by Asociación Española de Normalización in December of 2017.)
Vydáno: 2017-12-01
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UNE EN 60749-20-1:2009
Semiconductor devices - Mechanical and climatic test methods -- Part 20-1: Handling, packing, labelling and shipping of surface mount devices sensitive to the combined effect of moisture and soldering heat (Endorsed by AENOR in September of 2009.)
Vydáno: 2009-09-01
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UNE EN 60749-21:2011
Semiconductor devices - Mechanical and climatic test methods - Part 21: Solderability (Endorsed by AENOR in November of 2011.)
Vydáno: 2011-11-01
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UNE EN 60749-27:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (IEC 60749-27:2006) (Endorsed by AENOR in November of 2006.)
Vydáno: 2006-11-01
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UNE EN 60749-27:2006/A1:2012
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM) (Endorsed by AENOR in January of 2013.)
Vydáno: 2013-01-01
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UNE EN 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test (Endorsed by AENOR in November of 2011.)
Vydáno: 2011-11-01
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UNE EN 60749-3:2017
Semiconductor devices - Mechanical and climatic test methods - Part 3: External visual examination (Endorsed by Asociación Española de Normalización in July of 2017.)
Vydáno: 2017-07-01
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UNE EN 60749-35:2006
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Vydáno: 2007-01-01
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UNE EN 60749-5:2017
Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test (Endorsed by Asociación Española de Normalización in August of 2017.)
Vydáno: 2017-08-01
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32938 results
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