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Main page>20/30423207 DC BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
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sklademVydáno: 2020-09-11
20/30423207 DC BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

20/30423207 DC

BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices Part 9. Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

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23.97 €
Označení normy:20/30423207 DC
Počet stran:19
Vydáno:2020-09-11
Status:Draft for Comment
DESCRIPTION

20/30423207 DC


This standard 20/30423207 DC BS EN IEC 62951-9. Semiconductor devices. Flexible and stretchable semiconductor devices is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices

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