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Homepage>25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
sklademVydáno: 2025-07-18
25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope

25/30505052 DC

BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope

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Označení normy:25/30505052 DC
Počet stran:60
Vydáno:2025-07-18
Status:Draft for Comment
Počet stran (Anglicky):60
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25/30505052 DC


This standard 25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope is classified in these ICS categories:
  • 37.020 Optical equipment

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