Přihlásit seRegistrovat se
Jazyk czen
Menu
KontaktOBCHODNÁPOVĚDANovinky
Hledání
0
Celková cena
0 Kč
Cena s DPH / bez DPH
Hlavní stránka>25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope
Not available online - contact us!
sklademVydáno: 2025-07-18
25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope

25/30505052 DC

BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope

Měna
580 Kč
Označení normy:25/30505052 DC
Počet stran:60
Vydáno:2025-07-18
Status:Draft for Comment
Popis

25/30505052 DC


This standard 25/30505052 DC BS ISO 25387 Microbeam analysis — Analytical electron microscopy — Procedures for determining the point resolution of high-resolution transmission electron microscope is classified in these ICS categories:
  • 37.020 Optical equipment

Tisk