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>BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

sklademVydáno: 2003-06-19

BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

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Označení normy:	BS EN 60749-36:2003
Počet stran:	8
Vydáno:	2003-06-19
ISBN:	0 580 42065 5
Status:	Standard

DESCRIPTION

BS EN 60749-36:2003

This standard BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:

31.080.01 Semiconductor devices in general

Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.

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