>BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
sklademVydáno: 2003-06-19
BS EN 60749-36:2003
Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
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Označení normy:
BS EN 60749-36:2003
Počet stran:
8
Vydáno:
2003-06-19
ISBN:
0 580 42065 5
Status:
Standard
DESCRIPTION
BS EN 60749-36:2003
This standard BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
31.080.01 Semiconductor devices in general
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
