Přihlásit seRegistrovat se
Jazyk czen
Menu
KontaktOBCHODNÁPOVĚDANovinky
Hledání
0
Celková cena
0 Kč
Cena s DPH / bez DPH
Hlavní stránka>BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state
sklademVydáno: 2003-06-19
BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

BS EN 60749-36:2003

Semiconductor devices. Mechanical and climatic test methods Acceleration, steady state

Formát
Dostupnost
Cena a měna
Anglicky Zabezpečené PDF
K okamžitému stažení
3780 Kč
Anglicky Tisk
Skladem
3780 Kč
Označení normy:BS EN 60749-36:2003
Počet stran:8
Vydáno:2003-06-19
ISBN:0 580 42065 5
Status:Standard
Popis

BS EN 60749-36:2003


This standard BS EN 60749-36:2003 Semiconductor devices. Mechanical and climatic test methods is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices. It is an accelerated test designed to indicate types of structural and mechanical weaknesses not necessarily detected in shock and vibration test.
Tisk