BS EN IEC 60068-2-13:2021

• 31.080.01 Semiconductor devices in general
• 19.040 Environmental testing

This part of IEC 60068 specifies methods of test applicable to specimens which, during transportation, storage or in service, can be subjected to low air pressure.

The object of the low air pressure test is to determine the ability of components, equipment or other articles to be used, transported or stored at low air pressure.

Components, equipment or other articles to be used, transported or stored under a simultaneous combination of high or low temperature and low air pressure, where the combination is important for the stresses imposed on the articles or for the failure mechanisms, are then tested in accordance with IEC 60068-2-39.