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>BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification
sklademVydáno: 2020-02-26
BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

BS ISO 16700:2016 - TC

Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification

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Označení normy:BS ISO 16700:2016 - TC
Počet stran:58
Vydáno:2020-02-26
ISBN:978 0 539 10715 9
Status:Tracked Changes
DESCRIPTION

BS ISO 16700:2016 - TC


This standard BS ISO 16700:2016 - TC Tracked Changes. Microbeam analysis. Scanning electron microscopy. Guidelines for calibrating image magnification is classified in these ICS categories:
  • 37.020 Optical equipment

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