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20 results
First pagePrev12BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices Field-effect transistors
Semiconductor devices. Discrete devices Field-effect transistors
Vydáno: 2021-07-09
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Vydáno: 2006-09-29
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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Vydáno: 2010-06-30
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BS IEC 60747-4:2007+A1:2017
Semiconductor devices. Discrete devices Microwave diodes and transistors
Semiconductor devices. Discrete devices Microwave diodes and transistors
Vydáno: 2020-05-26
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BS IEC 63505:2025
Guidelines for measuring the threshold voltage V<sub>T</sub> of SiC MOSFETs
Guidelines for measuring the threshold voltage V<sub>T</sub> of SiC MOSFETs
Vydáno: 2025-04-25
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20 results
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