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25/30531418 DC
BS IEC 63673 Guidelines for Gate Charge (QG) test method for SIC MOSFET
BS IEC 63673 Guidelines for Gate Charge (QG) test method for SIC MOSFET
Vydáno: 2025-09-05
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BS IEC 60747-9:2019
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Semiconductor devices Discrete devices. Insulated-gate bipolar transistors (IGBTs)
Vydáno: 2019-11-22
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BS IEC 60747-8:2010+A1:2021
Semiconductor devices. Discrete devices Field-effect transistors
Semiconductor devices. Discrete devices Field-effect transistors
Vydáno: 2021-07-09
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25/30531414 DC
BS IEC 63672 Guidelines for evaluating DV/DT robustness of SIC power devices
BS IEC 63672 Guidelines for evaluating DV/DT robustness of SIC power devices
Vydáno: 2025-09-05
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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26/30553781 DC
BS IEC 60747-8 Amd.2 Amendment 2 - Semiconductor devices - Discrete devices Part 8: Field-effect transistors
BS IEC 60747-8 Amd.2 Amendment 2 - Semiconductor devices - Discrete devices Part 8: Field-effect transistors
Vydáno: 2026-07-17
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BS EN 62373:2006
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
Vydáno: 2006-09-29
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BS EN 62417:2010
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Semiconductor devices. Mobile ion tests for metal-oxide semiconductor field effect transistors (MOSFETs)
Vydáno: 2010-06-30
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BS IEC 60747-4:2007+A1:2017
Semiconductor devices. Discrete devices Microwave diodes and transistors
Semiconductor devices. Discrete devices Microwave diodes and transistors
Vydáno: 2020-05-26
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