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31.140 Piezoelektrické a dielektrické součástky
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BS EN 61338-4-1:2005
Waveguide type dielectric resonators Blank detail specification
Waveguide type dielectric resonators Blank detail specification
Vydáno: 2005-12-16
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BS EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Vydáno: 2021-11-05
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BS EN IEC 62604-2:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Vydáno: 2022-10-31
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BS EN 60444-9:2007
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Measurement of quartz crystal unit parameters Measurement of spurious resonances of piezoelectric crystal units
Vydáno: 2007-05-31
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BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Vydáno: 2019-04-18
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BS EN IEC 62276:2025
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Vydáno: 2025-04-30
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Vydáno: 2019-04-24
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BS EN 61338-2:2004
Waveguide type dielectric resonators Guidelines for oscillator and filter applications
Waveguide type dielectric resonators Guidelines for oscillator and filter applications
Vydáno: 2004-10-20
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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Vydáno: 1993-09-15
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