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BS EN IEC 60444-6:2021
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Measurement of quartz crystal unit parameters Measurement of drive level dependence (DLD)
Vydáno: 2021-11-05
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BS IEC 62047-33:2019
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Semiconductor devices. Micro-electromechanical devices MEMS piezoresistive pressure-sensitive device
Vydáno: 2019-04-18
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BS EN 62575-2:2012
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Guidelines for the use
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Guidelines for the use
Vydáno: 2012-10-31
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BS EN IEC 62276:2025
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Vydáno: 2025-04-30
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BS EN IEC 62604-2:2022
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Guidelines for the use
Vydáno: 2022-10-31
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BS EN 61337-1:2004
Filters using waveguide type dielectric resonators Generic specification
Filters using waveguide type dielectric resonators Generic specification
Vydáno: 2005-03-10
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BS EN 61338-2:2004
Waveguide type dielectric resonators Guidelines for oscillator and filter applications
Waveguide type dielectric resonators Guidelines for oscillator and filter applications
Vydáno: 2004-10-20
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BS EN 60793-1-33:2017
Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Vydáno: 2017-12-07
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