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31.140 Piezoelektrické a dielektrické součástky
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Vydáno: 2019-04-24
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BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Vydáno: 1995-04-15
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BS EN 50324-1:2002
Piezoelectric properties of ceramic materials and components Terms and definitions
Piezoelectric properties of ceramic materials and components Terms and definitions
Vydáno: 2002-10-10
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BS EN IEC 62884-3:2018
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Frequency aging test methods
Vydáno: 2018-05-30
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BS EN 60444-8:2017
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Vydáno: 2017-05-26
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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Vydáno: 2019-04-16
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BS EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Vydáno: 2015-12-31
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BS EN IEC 62276:2025 - TC
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Vydáno: 2025-05-15
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24/30493194 DC
BS EN IEC 60679-2 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 2: Guide to the use of quartz crystal oscillators
BS EN IEC 60679-2 Piezoelectric, dielectric and electrostatic oscillators of assessed quality Part 2: Guide to the use of quartz crystal oscillators
Vydáno: 2024-05-10
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24/30505500 DC
BS EN IEC 63041-2 Piezoelectric sensors Part 2: Chemical and biochemical sensors
BS EN IEC 63041-2 Piezoelectric sensors Part 2: Chemical and biochemical sensors
Vydáno: 2024-11-22
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BS EN IEC 62604-1:2022 - TC
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Tracked Changes. Surface acoustic wave (SAW) and bulk acoustic wave (BAW) duplexers of assessed quality Generic specification
Vydáno: 2023-01-23
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