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31.140 Piezoelektrické a dielektrické součástky
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BS EN 168100:1995
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal units (capability approval)
Vydáno: 1995-04-15
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BS EN 50324-1:2002
Piezoelectric properties of ceramic materials and components Terms and definitions
Piezoelectric properties of ceramic materials and components Terms and definitions
Vydáno: 2002-10-10
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BS EN 61837-3:2015
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Metal enclosures
Vydáno: 2015-12-31
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BS IEC 62047-36:2019
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Semiconductor devices. Micro-electromechanical devices Environmental and dielectric withstand test methods for MEMS piezoelectric thin films
Vydáno: 2019-04-24
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BS EN 60793-1-33:2017 - TC
Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Tracked Changes. Optical fibres Measurement methods and test procedures - Stress corrosion susceptibility
Vydáno: 2020-02-25
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BS EN 60368-4:2001
Piezoelectric filters Sectional specification. Capability approval
Piezoelectric filters Sectional specification. Capability approval
Vydáno: 2001-06-15
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BS EN 60444-8:2017
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Measurement of quartz crystal unit parameters Test fixture for surface mounted quartz crystal units
Vydáno: 2017-05-26
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BS IEC 62047-34:2019
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Semiconductor devices. Micro-electromechanical devices Test methods for MEMS piezoresistive pressure-sensitive device on wafer
Vydáno: 2019-04-16
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BS EN 60444-2:1997
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Measurement of quartz crystal unit parameters Phase offset method for measurement of motional capacitance of quartz crystal units
Vydáno: 1993-09-15
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