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>BSI Standards>31 ELEKTRONIKA>31.140 Piezoelektrické a dielektrické součástky 

31.140 Piezoelektrické a dielektrické součástky 

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111 results
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24/30505500 DC
BS EN IEC 63041-2 Piezoelectric sensors Part 2: Chemical and biochemical sensors
Vydáno: 2024-11-22
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BS EN IEC 62276:2025 - TC
Tracked Changes. Single crystal wafers for surface acoustic wave (SAW) device applications. Specifications and measuring methods
Vydáno: 2025-05-15
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DD IEC/TS 61994-4-2:2011
Piezoelectric, dielectric and electrostatic devices and associated materials for frequency control, selection and detection. Glossary Piezoelectric and dielectric materials. Piezoelectric ceramics
Vydáno: 2011-04-30
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BS EN 169100:1993
Harmonized system of quality assessment for electronic components. Sectional specification: quartz crystal controlled oscillators (capability approval)
Vydáno: 1993-08-15
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BS EN 168101:1997
Harmonized system of quality assessment for electronic components. Blank detail specification: quartz crystal units (capability approval)
Vydáno: 1990-12-31
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BS EN 60444-5:1997
Measurement of quartz crystal unit parameters Methods for the determination of equivalent electrical parameters using automatic network analyzer techniques and error correction
Vydáno: 1995-10-15
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BS EN 62884-2:2017
Measurement techniques of piezoelectric, dielectric and electrostatic oscillators Phase jitter measurement method
Vydáno: 2017-12-08
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BS EN 61338-4:2005
Waveguide type dielectric resonators Sectional specification
Vydáno: 2005-12-16
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BS EN 61019-2:2005
Surface acoustic wave (SAW) resonators Guide to the use
Vydáno: 2005-10-18
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BS EN 60679-3:2013
Quartz crystal controlled oscillators of assessed quality Standard outlines and lead connections
Vydáno: 2013-07-31
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BS EN 61837-1:2012
Surface mounted piezoelectric devices for frequency control and selection. Standard outlines and terminal lead connections Plastic moulded enclosure outlines
Vydáno: 2012-09-30
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BS EN 61338-1-5:2015
Waveguide type dielectric resonators General information and test conditions. Measurement method of conductivity at interface between conductor layer and dielectric substrate at microwave frequency
Vydáno: 2015-09-30
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111 results
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