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31.140 Piezoelektrické a dielektrické součástky
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BS EN 168201:1996
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval)
Harmonized system of quality assessment for electronic components. Blank detail specification. Quartz crystal units. (Qualification approval)
Vydáno: 1996-04-15
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BS EN 60679-4:1998
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Quartz crystal controlled oscillators of assessed quality Sectional specification. Capability approval
Vydáno: 1998-05-15
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BS EN 62575-1:2016
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
Radio frequency (RF) bulk acoustic wave (BAW) filters of assessed quality Generic specification
Vydáno: 2016-03-31
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BS EN 60862-3:2003
Surface acoustic wave (SAW) filters of assessed quality Standard outlines
Surface acoustic wave (SAW) filters of assessed quality Standard outlines
Vydáno: 2004-02-16
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BS EN 61240:2017
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
Piezoelectric devices. Preparation of outline drawings of surface-mounted devices (SMD) for frequency control and selection. General rules
Vydáno: 2017-01-31
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BS EN 60368-3:2010
Piezoelectric filters of assessed quality Standard outlines and lead connections
Piezoelectric filters of assessed quality Standard outlines and lead connections
Vydáno: 2011-02-28
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BS EN 169000:1993
Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
Harmonized system of quality assessment for electronic components. Generic specification. Quartz crystal controlled oscillators
Vydáno: 1993-08-15
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BS EN 50324-2:2002
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Piezoelectric properties of ceramic materials and components Methods of measurement. Low power
Vydáno: 2002-10-10
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BS IEC 62047-37:2020
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Semiconductor devices. Micro-electromechanical devices Environmental test methods of MEMS piezoelectric thin films for sensor application
Vydáno: 2023-04-05
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