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>IEC 60747-5-18:2026 - Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
sklademVydáno: 2026-06-11
IEC 60747-5-18:2026 - Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

IEC 60747-5-18:2026

Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes

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Označení normy:IEC 60747-5-18:2026
Vydáno:2026-06-11
Edice:1
ICS:31.080.99
Počet stran (Anglicky):17
ISBN (Anglicky):9782832713044
DESCRIPTION

IEC 60747-5-18:2026

IEC 60747-5-18:2026 specifies the measuring methods of macro photoluminescence (PL) for red, green, and blue epitaxial wafers of micro light emitting diodes (LEDs) prior to chip fabrication processes. Wafer sizes being considered are 4 in, 6 in, and 8 in in diameter.

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