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Main page>IEC 60749-10:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock
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sklademVydáno: 2002-04-09
IEC 60749-10:2002 - Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

IEC 60749-10:2002

Semiconductor devices - Mechanical and climatic test methods - Part 10: Mechanical shock

Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 10: Chocs mécaniques

CURRENCY
11.84 €
Označení normy:IEC 60749-10:2002
Vydáno:2002-04-09
Jazyk:Anglicky/Francouzsky
DESCRIPTION

IEC 60749-10:2002

Describes a shock test intended to determine the suitability of component parts for use in electronic equipment which may be subjected to moderately severe shocks as a result of suddenly applied forces or abrupt changes in motion produced by rough handling, transportation, or field operation. Shock of this type may disturb operating characteristics, particularly if the shock pulses are repetitive. This is a destructive test. It is normally applicable to cavity-type packages. The contents of the corrigendum of August 2003 have been included in this copy.