Log inSign up
LANGUAGE czen
Menu
ContactSTOREFAQNews
SEARCH
0
Total price
0 €
PRICES include / exclude VAT
Main page>IEC 60749-23:2004/AMD1:2011 - Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Not available online - contact us!
sklademVydáno: 2011-01-27
IEC 60749-23:2004/AMD1:2011 - Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

IEC 60749-23:2004/AMD1:2011

Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life

Amendement 1 - Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23: Durée de vie en fonctionnement à haute température

CURRENCY
11.84 €
Označení normy:IEC 60749-23:2004/AMD1:2011
Vydáno:2011-01-27
Edice:1
ICS:31.080.01
DESCRIPTION

IEC 60749-23:2004/AMD1:2011

Print