PRICES include / exclude VAT
Not available online - contact us!
sklademVydáno: 2004-02-23
IEC 60749-23:2004
Semiconductor devices - Mechanical and climatic test methods - Part 23: High temperature operating life
Dispositifs à semiconducteurs - Méthodes d'essais mécaniques et climatiques - Partie 23 : Durée de vie en fonctionnement à haute température
CURRENCY
| Označení normy: | IEC 60749-23:2004 |
| Vydáno: | 2004-02-23 |
| Edice: | 1 |
| ICS: | 31.080.01 |
DESCRIPTION
IEC 60749-23:2004
This test is used to determine the effects of bias conditions and temperature on solid state devices over time. It simulates the device operating condition in an accelerated way, and is primarily used for device qualification and reliability monitoring.