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IEC 60749-19:2003/AMD1:2010
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Amendment 1 - Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Vydáno: 2010-07-28
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IEC 60749-19:2003+AMD1:2010 CSV
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Semiconductor devices - Mechanical and climatic test methods - Part 19: Die shear strength
Vydáno: 2010-11-29
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IEC 60749-11:2002
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Semiconductor devices - Mechanical and climatic test methods - Part 11: Rapid change of temperature - Two-fluid-bath method
Vydáno: 2002-04-12
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IEC 60749-2:2002
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Semiconductor devices - Mechanical and climatic test methods - Part 2: Low air pressure
Vydáno: 2002-04-12
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IEC 61666:2010
Industrial systems, installations and equipment and industrial products - Identification of terminals within a system
Industrial systems, installations and equipment and industrial products - Identification of terminals within a system
Vydáno: 2010-08-19
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IEC 61643-311:2013
Components for low-voltage surge protective devices - Part 311: Performance requirements and test circuits for gas discharge tubes (GDT)
Components for low-voltage surge protective devices - Part 311: Performance requirements and test circuits for gas discharge tubes (GDT)
Vydáno: 2013-04-11
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Anglicky/Francouzsky Hardcopy
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IEC 61747-10-2:2014
Liquid crystal display devices - Part 10-2: Environmental, endurance and mechanical test methods - Environmental and endurance
Liquid crystal display devices - Part 10-2: Environmental, endurance and mechanical test methods - Environmental and endurance
Vydáno: 2014-09-03
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