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sklademVydáno: 2000-12-07
ISO 14975:2000
ISO 14975:2000 - Surface chemical analysis — Information formats
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| Označení normy: | ISO 14975:2000 |
| Vydání: | 1 |
| Vydáno: | 2000-12-07 |
| Počet stran (Anglicky): | 17 |
DESCRIPTION
ISO 14975:2000
This International Standard specifies a format to supplement ISO 14976 to transfer data for the creation, expansion
and revision of a surface chemical analysis spectral database. The format is applied to Auger electron
spectroscopy (AES) and X-ray photoelectron spectroscopy (XPS) spectral data.
