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sklademVydáno: 2025
ISO 17297:2025
ISO 17297:2025-Microbeam analysis — Focused ion beam application for TEM specimen preparation — Vocabulary
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| Označení normy: | ISO 17297:2025 |
| Počet stran: | 14 |
| Vydání: | 1 |
| Vydáno: | 2025 |
| Jazyk: | Anglicky |
DESCRIPTION
ISO 17297:2025
This document defines the most commonly used terms for transmission electron microscopy (TEM) specimen preparation using focused ion beam (FIB).