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IEC TR 62453-51-10:2017
Field device tool (FDT) interface specification - Part 51-10: Communication implementation for common object model - IEC 61784 CPF 1
Field device tool (FDT) interface specification - Part 51-10: Communication implementation for common object model - IEC 61784 CPF 1
Vydáno: 2017-05-11
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446.14 €
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Anglicky Hardcopy
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475.49 €
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Anglicky/Francouzsky Hardcopy
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93.92 €
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93.92 €
Anglicky Hardcopy
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346.35 €
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IEC TR 62453-51-20:2017
Field device tool (FDT) interface specification - Part 51-20: Communication implementation for common object model - IEC 61784 CPF 2
Field device tool (FDT) interface specification - Part 51-20: Communication implementation for common object model - IEC 61784 CPF 2
Vydáno: 2017-06-15
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IEC 62715-6-1:2018
Flexible display devices - Part 6-1: Mechanical test methods - Deformation tests
Flexible display devices - Part 6-1: Mechanical test methods - Deformation tests
Vydáno: 2018-04-20
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IEC 60749-32:2002
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Semiconductor devices - Mechanical and climatic test methods - Part 32: Flammability of plastic-encapsulated devices (externally induced)
Vydáno: 2002-08-30
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IEC 60761-5:2002
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
Equipment for continuous monitoring of radioactivity in gaseous effluents - Part 5: Specific requirements for tritium monitors
Vydáno: 2002-01-16
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135.02 €
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Anglicky/Francouzsky Hardcopy
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58.70 €
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58.70 €
IEC 60754-2:2011
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Test on gases evolved during combustion of materials from cables - Part 2: Determination of acidity (by pH measurement) and conductivity
Vydáno: 2011-11-17
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Anglicky/Francouzsky Hardcopy
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135.02 €
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135.02 €
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135.02 €
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IEC 60749-29:2011
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Semiconductor devices - Mechanical and climatic test methods - Part 29: Latch-up test
Vydáno: 2011-04-07
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