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Main page>UNE EN 60747-5-3:2001/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods
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sklademVydáno: 2023-10-02
UNE EN 60747-5-3:2001/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

UNE EN 60747-5-3:2001/A1:2002

Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods

Dispositivos discretos de semiconductores y circuitos integrados. Parte 5-3: Dispositivos optoelectrónicos. Métodos de medida. (Ratificada por AENOR en noviembre de 2002)

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72.1 €
Označení normy:UNE EN 60747-5-3:2001/A1:2002
Počet stran:16
Vydáno:2023-10-02
DESCRIPTION

This standard UNE EN 60747-5-3:2001/A1:2002 Discrete semiconductor devices and integrated circuits - Part 5-3: Optoelectronic devices - Measuring methods is classified in these ICS categories:

  • 31.260
  • 31.080.99
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