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Main page>UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.
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sklademVydáno: 2003-05-30
UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.

UNE EN 60749-10:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock.

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 10: Choques mecánicos.

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43.28 €
Označení normy:UNE EN 60749-10:2003
Počet stran:15
Vydáno:2003-05-30
Status:Norma
DESCRIPTION

This standard UNE EN 60749-10:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 10: Mechanical shock. is classified in these ICS categories:

  • 31.080.01
Categories:
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