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Main page>UNE EN 60749-13:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere.
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sklademVydáno: 2003-05-30
UNE EN 60749-13:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere.

UNE EN 60749-13:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere.

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 13: Atmósfera salina.

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38.59 €
Označení normy:UNE EN 60749-13:2003
Počet stran:17
Vydáno:2003-05-30
DESCRIPTION

This standard UNE EN 60749-13:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 13: Salt atmosphere. is classified in these ICS categories:

  • 31.080.01
Categories:
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