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>UNE EN 60749-23:2005/A1:2011 - Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
sklademVydáno: 2011-12-21
UNE EN 60749-23:2005/A1:2011 - Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

UNE EN 60749-23:2005/A1:2011

Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life

Dispositivos semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 23: Vida de funcionamiento a alta temperatura.

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Anglicky PDF
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38.40 €
Anglicky Hardcopy
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38.40 €
Španělsky PDF
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38.40 €
Španělsky Hardcopy
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Označení normy:UNE EN 60749-23:2005/A1:2011
Počet stran:14
Vydáno:2011-12-21
Status:Změna
Počet stran (Španělsky):8
DESCRIPTION

UNE EN 60749-23:2005/A1:2011

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