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sklademVydáno: 2018-04-01
UNE EN IEC 60749-12:2018
Semiconductor devices - Mechanical and climatic test methods - Part 12: Vibration, variable frequency (Endorsed by Asociación Española de Normalización in April of 2018.)
Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 12: Vibraciones, frecuencias variables. (Ratificada por la Asociación Española de Normalización en abril de 2018.)
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| Označení normy: | UNE EN IEC 60749-12:2018 |
| Počet stran: | 15 |
| Vydáno: | 2018-04-01 |
| Status: | Norma |
DESCRIPTION
UNE EN IEC 60749-12:2018
This part of IEC 60749 describes a test to determine the effect of variable frequency vibration, within the specified frequency range, on internal structural elements. This is a destructive test. It is normally applicable to cavity-type packages. NOTE This test method describes a swept sine test. A random vibration test is described in JEDEC document JESD 22-B103.
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