Resistance measurements are typically compromised by a variety of phenomena, like e.g. serial resistance in the measurement path, self-heating or non-ohmic properties. Whether the effect of such phenomena on a resistance measurement is acceptable or not depends on the magnitude of each effect in comparison to the resistance and to the required accuracy. Hence the risk of faulty resistance measurements increases with decreasing resistance, and with tightening of the permissible tolerance on resistance. This International Standard specifies methods of measurement and associated test conditions which eliminate or reduce the influence of the adversary phenomena in order to improve the achievable accuracy of low resistance measurements. The methods described in this International Standard are applicable for the individual measurement of the resistance of an individual resistor, and also for resistance measurements as part of a test sequence. They are applied if prescribed by a relevant component specification, or if agreed between a customer and a manufacturer.