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sklademVydáno: 2023-06-01
UNE EN IEC 63287-2:2023
Semiconductor devices - Guidelines for reliability qualification plans - Part 2: Concept of mission profile (Endorsed by Asociación Española de Normalización in June of 2023.)
Dispositivos semiconductores. Directrices de calificación de semiconductores genéricos. Parte 2: Concepto de perfil de misión (Ratificada por la Asociación Española de Normalización en junio de 2023.)
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| Označení normy: | UNE EN IEC 63287-2:2023 |
| Počet stran: | 24 |
| Vydáno: | 2023-06-01 |
| Status: | Norma |
DESCRIPTION
UNE EN IEC 63287-2:2023
This part of IEC 63287 gives guidelines for the development of reliability qualification plans using the concept of mission profile, based on the environmental conditioning and proposed usage of the product. This document is not intended for military- and space-related applications.
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