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Main page>21/30440431 DC BS EN IEC 63068-4. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 4. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence
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sklademVydáno: 2021-07-09
21/30440431 DC BS EN IEC 63068-4. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 4. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

21/30440431 DC

BS EN IEC 63068-4. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 4. Procedure for identifying and evaluating defects using a combined method of optical inspection and photoluminescence

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23.56 €
Označení normy:21/30440431 DC
Počet stran:26
Vydáno:2021-07-09
Status:Draft for Comment
DESCRIPTION

21/30440431 DC


This standard 21/30440431 DC BS EN IEC 63068-4. Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices is classified in these ICS categories:
  • 31.080.99 Other semiconductor devices

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