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Homepage>23/30456515 DC BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Part 2. Method of determining the etch pit density
sklademVydáno: 2023-10-09
23/30456515 DC BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Part 2. Method of determining the etch pit density

23/30456515 DC

BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Part 2. Method of determining the etch pit density

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Označení normy:23/30456515 DC
Počet stran:34
Vydáno:2023-10-09
Status:Draft for Comment
DESCRIPTION

23/30456515 DC


This standard 23/30456515 DC BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects is classified in these ICS categories:
  • 81.060.30 Advanced ceramics

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