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sklademVydáno: 2023-10-09
23/30456515 DC
BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects Part 2. Method of determining the etch pit density
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| Označení normy: | 23/30456515 DC |
| Počet stran: | 34 |
| Vydáno: | 2023-10-09 |
| Status: | Draft for Comment |
Popis
23/30456515 DC
This standard 23/30456515 DC BS ISO 5618-2. Fine ceramics (advanced ceramics, advanced technical ceramics). Test method for GaN crystal surface defects is classified in these ICS categories:
- 81.060.30 Advanced ceramics