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Main page>26/30551908 DC BS EN IEC 62047-62 Semiconductor devices - Micro-electromechanical systems Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation
sklademVydáno: 2026-07-03
26/30551908 DC BS EN IEC 62047-62 Semiconductor devices - Micro-electromechanical systems Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation

26/30551908 DC

BS EN IEC 62047-62 Semiconductor devices - Micro-electromechanical systems Part 62: Electrical resistance test method for hybrid MEMS materials under combined tensile and torsional deformation

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Označení normy:26/30551908 DC
Počet stran:19
Vydáno:2026-07-03
Status:Draft for Comment
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26/30551908 DC


This standard 26/30551908 DC BS EN IEC 62047-62 Semiconductor devices - Micro-electromechanical systems is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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