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>26/30559865 DC Draft BS IEC 63551-1 Semiconductor devices. Chip-scale testing for autonomous vehicles Part 1: Combined LD-PD for LiDAR
sklademVydáno: 2026-04-15
26/30559865 DC Draft BS IEC 63551-1 Semiconductor devices. Chip-scale testing for autonomous vehicles Part 1: Combined LD-PD for LiDAR

26/30559865 DC

Draft BS IEC 63551-1 Semiconductor devices. Chip-scale testing for autonomous vehicles Part 1: Combined LD-PD for LiDAR

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Označení normy:26/30559865 DC
Počet stran:25
Vydáno:2026-04-15
Status:Draft for Comment
Alternativní označení:Draft BS IEC 63551-1 Semiconductor devices
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26/30559865 DC


This standard 26/30559865 DC Draft BS IEC 63551-1 Semiconductor devices. Chip-scale testing for autonomous vehicles is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general

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