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>26/30564419 DC BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR
sklademVydáno: 2026-05-29
26/30564419 DC BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR

26/30564419 DC

BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR

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Označení normy:26/30564419 DC
Počet stran:28
Vydáno:2026-05-29
Status:Draft for Comment
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26/30564419 DC


This standard 26/30564419 DC BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles is classified in these ICS categories:
  • 31.080.01 Semiconductor devices in general
  • 31.080.99 Other semiconductor devices

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