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Homepage>BSI Standards>31 ELEKTRONIKA>31.200 Integrované obvody. Mikroelektronika

31.200 Integrované obvody. Mikroelektronika

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133 results
First page123...56781012Last page
BS CECC 63100:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits
Vydáno: 1985-01-31
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BS EN 190101:1994
Specification for harmonized system of quality assessment for electronic components. Family specification: digital integrated TTL circuits series 54, 64, 74, 84
Vydáno: 1990-07-15
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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Vydáno: 2014-09-30
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BS CECC 63200:1985
Harmonized system of quality assessment for electronic components: sectional specification: film and hybrid integrated circuits (capability approval)
Vydáno: 1985-06-28
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BS CECC 90113:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS ultra-violet light erasable electrically programmable read only memories silicon monolithic circuits
Vydáno: 1987-05-15
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BS QC 790109:1992
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits.Family specification for HCMOS digital integrated circuits series 54/74 HC, 54/74 HCT, 54/74 HCU
Vydáno: 1992-05-15
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BS IEC 60748-2-12:2001
Semiconductor devices. Integrated circuits. Digital integrated circuits Blank detail specification for programmable logic devices (PLDs)
Vydáno: 2001-06-15
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BS EN 61943:1999
Integrated circuits. Manufacturing line approval application guideline
Vydáno: 1999-12-15
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BS IEC 60748-23-4:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Blank detail specification
Vydáno: 2002-06-18
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BS EN 62132-4:2006
Integrated circuits. Measurement of electromagnetic immunity. 150 kHz to 1 GHz Direct RF power injection method
Vydáno: 2006-07-31
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BS QC 790101:1992
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for semiconductor integrated circuits excluding hybrid circuits. Internal visual examination for semiconductor integrated circuits excluding hybrid circuits
Vydáno: 1992-08-15
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BS EN 62433-3:2017
EMC IC modelling Models of integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
Vydáno: 2017-12-13
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133 results
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