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31.200 Integrované obvody. Mikroelektronika
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DD ENV 190000-6:1994
Generic specification: monolithic integrated circuits Procedure for approval and quality management
Generic specification: monolithic integrated circuits Procedure for approval and quality management
Vydáno: 1994-08-15
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DD IEC/TS 62215-2:2007
Integrated circuits. Measurement of impulse immunity Synchronous transient injection method
Integrated circuits. Measurement of impulse immunity Synchronous transient injection method
Vydáno: 2007-11-30
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DD IEC/TS 62404:2007
Logic digital integrated circuits. Specification for I/O interface model for integrated circuit (IMIC version 1.3)
Logic digital integrated circuits. Specification for I/O interface model for integrated circuit (IMIC version 1.3)
Vydáno: 2007-03-30
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380.22 €
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PD IEC/TR 61352:2006
Mnemonics and symbols for integrated circuits
Mnemonics and symbols for integrated circuits
Vydáno: 2006-07-17
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PD IEC/TR 61967-1-1:2015
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Vydáno: 2015-09-30
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334.21 €
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PD IEC/TR 62433-2-1:2010
EMC IC modelling Theory of black box modelling for conducted emission
EMC IC modelling Theory of black box modelling for conducted emission
Vydáno: 2011-02-28
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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Vydáno: 2014-09-30
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PD IEC/TS 62132-9:2014
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Integrated circuits. Measurement of electromagnetic immunity Measurement of radiated immunity. Surface scan method
Vydáno: 2014-09-30
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