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31.200 Integrované obvody. Mikroelektronika
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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Vydáno: 2014-09-30
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BS EN 60747-16-1:2002+A2:2017
Semiconductor devices Microwave integrated circuits. Amplifiers
Semiconductor devices Microwave integrated circuits. Amplifiers
Vydáno: 2018-04-10
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PD IEC/TR 61967-1-1:2015
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Integrated circuits. Measurement of electromagnetic emissions General conditions and definitions. Near-field scan data exchange format
Vydáno: 2015-09-30
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BS IEC 60748-4-3:2006
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Semiconductor devices. Integrated circuits Interface integrated circuits. Dynamic criteria for analogue-digital converters (ADC)
Vydáno: 2007-02-28
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BS IEC 63011-3:2018
Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via
Integrated circuits. Three dimensional integrated circuits Model and measurement conditions of through-silicon via
Vydáno: 2019-01-24
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BS EN 60684-3-145 to 147:2001
Specification for flexible insulating sleeving. Specification requirements for individual types of sleeving Extruded PTFE sleeving
Specification for flexible insulating sleeving. Specification requirements for individual types of sleeving Extruded PTFE sleeving
Vydáno: 2001-12-21
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