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>BSI Standards>31 ELEKTRONIKA>31.200 Integrované obvody. Mikroelektronika

31.200 Integrované obvody. Mikroelektronika

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136 results
First page1245678...101112Last page
BS EN 61967-5:2003
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of conducted emissions. Workbench Faraday Cage method
Vydáno: 2003-06-17
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PD IEC/TS 61967-3:2014
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. Surface scan method
Vydáno: 2014-09-30
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BS EN 60684-3-145 to 147:2001
Specification for flexible insulating sleeving. Specification requirements for individual types of sleeving Extruded PTFE sleeving
Vydáno: 2001-12-21
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21/30433680 DC
BS EN IEC 62228-7. Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers
Vydáno: 2021-02-05
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BS EN 61967-2:2005
Integrated circuits. Measurement of electromagnetic emissions, 150 kHz to 1 GHz Measurement of radiated emissions. TEM cell and wideband TEM cell method
Vydáno: 2006-01-23
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14/30310478 DC
BS EN 62433-3. EMC IC modelling. Part 3. Models of Integrated Circuits for EMI behavioural simulation. Radiated emissions modelling (ICEM-RE)
Vydáno: 2014-07-17
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24/30500170 DC
BS EN IEC 62228-7 Integrated circuits. EMC evaluation of transceivers Part 7. CXPI transceivers
Vydáno: 2024-09-06
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BS EN IEC 61967-8:2023
Integrated circuits. Measurement of electromagnetic emissions Measurement of radiated emissions. IC stripline method
Vydáno: 2023-06-15
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BS QC 760100:1997
Harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Sectional specification for film integrated circuits and hybrid film integrated circuits on the basis of the qualification approval procedures
Vydáno: 1997-08-15
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BS QC 790303:1994
Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Blank detail specification. Linear digital-to-analogue converters (DAC)
Vydáno: 1994-02-15
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BS CECC 90112:1987
Specification for harmonized system of quality assessment for electronic components. Blank detail specification. MOS read/write dynamic memories silicon monolithic circuits
Vydáno: 1987-08-15
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BS IEC 60748-23-3:2002
Semiconductor devices. Integrated circuits. Hybrid integrated circuits and film structures. Manufacturing line certification Manufacturers' self-audit checklist and report
Vydáno: 2002-06-18
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136 results
First page1245678...101112Last page