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>ISO 18452:2005-Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
sklademVydáno: 2005
ISO 18452:2005-Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

ISO 18452:2005

ISO 18452:2005-Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer

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Označení normy:ISO 18452:2005
Počet stran:9
Vydání:1
Vydáno:2005
DESCRIPTION

ISO 18452:2005


ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.
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