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sklademVydáno: 2005-11-16
ISO 18452:2005
ISO 18452:2005 - Fine ceramics (advanced ceramics, advanced technical ceramics) — Determination of thickness of ceramic films by contact-probe profilometer
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Anglicky PDF
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78.90 €
Francouzsky PDF
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78.90 €
Anglicky Hardcopy
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78.90 €
Francouzsky Hardcopy
In stock
78.90 €
| Označení normy: | ISO 18452:2005 |
| Vydání: | 1 |
| Vydáno: | 2005-11-16 |
| Počet stran (Anglicky): | 9 |
| Počet stran (Francouzsky): | 9 |
DESCRIPTION
ISO 18452:2005
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer. The method is suitable for film thicknesses in the range of 10 nm to 10 000 nm.