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Main page>ISO 24173:2009-Microbeam analysis-Guidelines for orientation measurement using electron backscatter diffraction
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sklademVydáno: 2009
ISO 24173:2009-Microbeam analysis-Guidelines for orientation measurement using electron backscatter diffraction

ISO 24173:2009

ISO 24173:2009-Microbeam analysis-Guidelines for orientation measurement using electron backscatter diffraction

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223.51 €
Označení normy:ISO 24173:2009
Počet stran:43
Vydání:1
Vydáno:2009
DESCRIPTION

ISO 24173:2009


ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.
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