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sklademVydáno: 2009
ISO 24173:2009
ISO 24173:2009-Microbeam analysis-Guidelines for orientation measurement using electron backscatter diffraction
Měna
| Označení normy: | ISO 24173:2009 |
| Počet stran: | 43 |
| Vydání: | 1 |
| Vydáno: | 2009 |
Popis
ISO 24173:2009
ISO 24173:2009 gives advice on how to generate reliable and reproducible crystallographic orientation measurements using electron backscatter diffraction (EBSD). It addresses the requirements for specimen preparation, instrument configuration, instrument calibration and data acquisition.