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sklademVydáno: 2003-07-15
ISO 6342:2003
ISO 6342:2003 - Micrographics — Aperture cards — Method of measuring thickness of buildup area
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| Označení normy: | ISO 6342:2003 |
| Vydání: | 2 |
| Vydáno: | 2003-07-15 |
| Počet stran (Anglicky): | 3 |
DESCRIPTION
ISO 6342:2003
ISO 6342:2003 specifies a method of measuring the thickness of the buildup area on aperture cards (camera and copy cards) for manufacturing and inspection purposes.