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Main page>UNE EN 60749-17:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation
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sklademVydáno: 2003-11-21
UNE EN 60749-17:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation

UNE EN 60749-17:2003

Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation

Dispositivos de semiconductores. Métodos de ensayo mecánicos y climáticos. Parte 17: Irradiación de neutrones.

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35.08 €
Označení normy:UNE EN 60749-17:2003
Počet stran:18
Vydáno:2003-11-21
DESCRIPTION

This standard UNE EN 60749-17:2003 Semiconductor devices - Mechanical and climatic test methods -- Part 17: Neutron irradiation is classified in these ICS categories:

  • 31.080.01
Categories:
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