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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Vydáno: 1987-10-30
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23.84 €
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262.23 €
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BS EN IEC 63244-1:2021
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Semiconductor devices. Semiconductor devices for wireless power transfer and charging General requirements and specifications
Vydáno: 2021-11-05
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BS IEC 60747-5-8:2019
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
Semiconductor devices Optoelectronic devices. Light emitting diodes. Test method of optoelectronic efficiencies of light emitting diodes
Vydáno: 2019-11-27
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23/30481371 DC
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
BS EN IEC 62047-4 Semiconductor devices. Micro-electromechanical devices Part 4. Generic specification for MEMS
Vydáno: 2023-10-20
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24/30488515 DC
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
BS EN IEC 62047-50. Semiconductor devices. Micro-electromechanical devices Part 50. MEMS capacitive microphone
Vydáno: 2024-03-05
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23/30479765 DC
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Vydáno: 2023-09-25
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BS EN IEC 60747-16-7:2022
Semiconductor devices Microwave integrated circuits. Attenuators
Semiconductor devices Microwave integrated circuits. Attenuators
Vydáno: 2023-05-25
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23/30476409 DC
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Vydáno: 2023-07-05
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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