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BS CECC 50000:1987
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Harmonized system of quality assessment for electronic components. Generic specification: discrete semiconductor devices
Vydáno: 1987-10-30
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BS EN 62047-26:2016
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Semiconductor devices. Micro-electromechanical devices Description and measurement methods for micro trench and needle structures
Vydáno: 2016-05-31
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BS EN IEC 60747-16-7:2022
Semiconductor devices Microwave integrated circuits. Attenuators
Semiconductor devices Microwave integrated circuits. Attenuators
Vydáno: 2023-05-25
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23/30479765 DC
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
BS IEC 63512. Test method for continuous-switching evaluation of gallium nitride power conversion devices
Vydáno: 2023-09-25
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23/30476409 DC
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
BS IEC 60947-10. Low-voltage switchgear and controlgear Part 10. Semiconductor Circuit-Breakers
Vydáno: 2023-07-05
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BS EN IEC 63364-1:2022
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Semiconductor devices. Semiconductor devices for IoT system Test method of sound variation detection
Vydáno: 2023-02-02
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BS IEC 63284:2022
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Semiconductor devices. Reliability test method by inductive load switching for gallium nitride transistors
Vydáno: 2022-11-11
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