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>BSI Standards>31 ELEKTRONIKA>31.080 Polovodičové součástky>31.080.99 Ostatní polovodičové součástky

31.080.99 Ostatní polovodičové součástky

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161 results
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BS IEC 62047-43:2024
Semiconductor devices. Micro-electromechanical devices Test method of electrical characteristics after cyclic bending deformation for flexible micro-electromechanical devices
Vydáno: 2024-03-22
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24/30497861 DC
BS EN IEC 63551-1. Semiconductor devices. Detection modules of autonomous land vehicle Part 1. Testing methods of detection performance for LiDAR
Vydáno: 2024-08-01
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24/30497109 DC
BS EN IEC 63068-5 Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Part 5. Test method for defects using X-ray topography
Vydáno: 2024-07-12
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24/30500166 DC
BS EN IEC 63550-4 Semiconductor devices. Neuromorphic devices Evaluation method of asymmetry in neuromorphic memristor devices
Vydáno: 2024-09-06
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BS EN 60146-2:2000
Semiconductor convertors. General requirements and line commutated convertors Self-commutated semiconductor converters including direct d.c. converters
Vydáno: 2000-08-15
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BS IEC 62951-2:2019
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation method for electron mobility, sub-threshold swing, and threshold voltage of flexible devices
Vydáno: 2019-04-30
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BS IEC 63068-1:2019
Semiconductor devices. Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices Classification of defects
Vydáno: 2019-05-10
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BS EN 62047-3:2006
Semiconductor devices. Micro-electromechanical devices Thin film standard test piece for tensile testing
Vydáno: 2006-11-30
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BS IEC 62047-29:2017
Semiconductor devices. Micro-electromechanical devices Electromechanical relaxation test method for freestanding conductive thin-films under room temperature
Vydáno: 2018-03-15
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BS EN 62047-14:2012
Semiconductor devices. Micro-electromechanical devices Forming limit measuring method of metallic film materials
Vydáno: 2012-05-31
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BS EN 62047-16:2015
Semiconductor devices. Micro-electromechanical devices Test methods for determining residual stresses of MEMS films. Wafer curvature and cantilever beam deflection methods
Vydáno: 2015-07-31
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BS IEC 62951-3:2018
Semiconductor devices. Flexible and stretchable semiconductor devices Evaluation of thin film transistor characteristics on flexible substrates under bulging
Vydáno: 2018-11-15
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161 results
First page123...579...121314Last page