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BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR
BS EN IEC 63551-2 Semiconductor devices - Chip-scale testing for autonomous vehicles Part 2: Optical performance of LiDAR
Vydáno: 2026-05-29
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BS IEC 62047-49:2025
Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers
Semiconductor devices. Micro-electromechanical devices Temperature and humidity test methods for piezoelectric MEMS cantilevers
Vydáno: 2025-12-03
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