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BS EN IEC 63287-2:2023
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Semiconductor devices. Guidelines for reliability qualification plans Concept of mission profile
Vydáno: 2023-05-23
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BS EN IEC 60747-16-9:2024
Semiconductor devices Microwave integrated circuits. Phase shifters
Semiconductor devices Microwave integrated circuits. Phase shifters
Vydáno: 2024-11-20
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BS IEC 62047-53:2025
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Semiconductor devices. Micro-electromechanical devices MEMS electrothermal transfer device
Vydáno: 2025-10-08
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BS IEC 63602:2026
Guidelines for representing switching losses of SIC MOSFETs in datasheets
Guidelines for representing switching losses of SIC MOSFETs in datasheets
Vydáno: 2026-02-26
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26/30539985 DC
BS EN IEC 63608-2 Reliability evaluation methods for vibration energy harvesters Part 2: Temperature and humidity
BS EN IEC 63608-2 Reliability evaluation methods for vibration energy harvesters Part 2: Temperature and humidity
Vydáno: 2026-06-12
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BS EN 62047-13:2012
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Semiconductor devices. Micro-electromechanical devices Bend-and shear-type test methods of measuring adhesive strength for MEMS structures
Vydáno: 2012-05-31
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BS IEC 62047-27:2017
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
Semiconductor devices. Micro-electromechanical devices Bond strength test for glass frit bonded structures using micro-chevron-tests (MCT)
Vydáno: 2020-07-22
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